FIB & SEM

Orion NanoFab

NV40 FIB with Ga & GIS  sources

Carl Zeiss XB1540 “Cross-Beam” with EDX

The "Cross-Beam” focussed-ion-beam microscope at London Centre for Nanotechnology in University College London is a unique instrument in a unique location. The instrument is equipped not only with an in situ field-emission scanning electron microscope for gallium-free imaging, but also an in situ low-voltage argon-ion-miller for gallium-free nanofabrication. The instrument is located in a  purpose-built class 10,000 cleanroom in the basement level of the London Centre for Nanotechnology.